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  • Michael Gössel; Vitaly Ocheretny; Egor Sogomonyan; Daniel Marienfeld
    978-1-4020-8420-1
    2008
    Edition 1
    • Of great importance for the emerging nanotechnologies with their increasing numbers of transient faults
    • Shows in a systematic way how the best possible state-of-the-art digital error detection circuits can be designed
    • The only book which describes the most important methods of concurrent checking developed in the last 15 years
    • The only book which contains a detailed description of the best possible error detection circuits for all types of adders
    • Shows for the first time how soft-error correction can be combined with concurrent checking

    €180

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