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  • eBook:CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

    CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

    Process-Aware SRAM Design and Test
    Andrei Pavlov; Manoj Sachdev
    978-1-4020-8363-1
    2008
    Edition 1
    • Gives a process-aware perspective on SRAM circuit design and test
    • Provides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise Margin
    • Introduces the concept of stability fault modelling
    • Provides an Overview of specialized Design for Testability techniques for SRAM stability test
    • Addresses soft-error considerations of SRAM design

    €300

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