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  • Oleg Semenov; Hossein Sarbishaei; Manoj Sachdev
    978-1-4020-8301-3
    2008
    Edition 1
    • Strategies for design-oriented ESD protection
    • Distributed ESD protection networks optimized for sub-90nm CMOS ICs
    • ESD protection strategies for smart power ICs used in automotive industry
    • The impact of burn-in testing (accelerated test methods) on the ESD robustness
    • The charge board ESD (CBM) testing used for wireless products

    €320

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