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  • Patrick Echlin
    978-0-387-85731-2
    2009
    Edition 1
    • Identifies problems that all specimens present in examining their structure and analysis in the SEM
    • Describes a series of protocols to ensure that a specimen is properly prepared once the particular problems are identified
    • Guides the reader through a general approach to the problem before a particular procedure is applied to the requirements of a given sample
    • Designed both as an introduction for the novice and as a guide for the practicing scanning microscopist

    €280

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