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  • High-Quality Delay Tests
    Nisar Ahmed
    978-0-387-75728-5
    2008
    Edition 1
    • Identifies defects in traditional at-speed test methods
    • Proposes new techniques and methodologes to improve the overall quality of transition fault tests
    • Includes discussion of the effects of IR-drop
    • Provides an introduction to path delay and transition delay fault models and test methods
    • Includes supplementary material: sn.pub/extras

    €180

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