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  • Test, Defect Tolerance, and Reliability
    Mohammad Tehranipoor
    978-0-387-74747-7
    2008
    Edition 1
    • Covers various technologies that have been suggested by researchers over the last decades
    • Includes technologies such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), nanowires and carbon nanotubes
    • Discusses different aspects of test and defect tolerance for crossbar-based nanoscale devices
    • Contains five chapters focusing on test, defect tolerance and reliability for QCA circuits
    • Presents methods for testing and diagnosis of realistic defects in digital microfluidic biochips
    • Includes three chapters dealing with the reliability of CMOS scale devices, developing nanoscale processors and future molecular electronics-based circuits
    • Includes supplementary material: sn.pub/extras

    €280

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