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  • Telman Aliev
    978-0-387-71754-8
    2007
    Edition 1
    • Includes several technologies that cover the initial stage of the origin of the defect
    • Theoretically proves the various technologies
    • Exemplifies the applications for solving problems concerning noise monitoring at the beginning of the defect origin
    • Includes supplementary material: sn.pub/extras

    €180

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