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  • Terry L. Alford; L.C. Feldman; James W. Mayer
    978-0-387-29261-8
    2007
    Edition 1
    • Comprehensively treats the major characterization techniques used to analyze thin films from the micro- to nanoscale
    • Incorporates the use of x-ray fluorescence (XRF) in thin film analysis
    • Focuses on surface analysis and includes analytical techniques such as XRF, XRD, and electron microscopy
    • Offers a modern version (with a nano focus) on the well regarded 1986 book, 'Surface and Thin Film Analysis' written by Feldman and Mayer
    • Includes supplementary material: sn.pub/extras

    €419

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