"eBook ISBN","Title","Subtitle","Authors/editors","Copyright year","Edition","DOI","Price (EUR)","Additional info"
"978-981-10-7470-7","VLSI Design and Test","21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers","Brajesh Kumar Kaushik; Sudeb Dasgupta; Virendra Singh",2017,"1","https://doi.org/10.1007/978-981-10-7470-7",180,""