"eBook ISBN","Title","Subtitle","Authors/editors","Copyright year","Edition","DOI","Price (EUR)","Additional info"
"978-3-662-45240-0","Scanning Probe Microscopy","Atomic Force Microscopy and Scanning Tunneling Microscopy","Bert Voigtländer",2015,"1","https://doi.org/10.1007/978-3-662-45240-0",400,""