"eBook ISBN","Title","Subtitle","Authors/editors","Copyright year","Edition","DOI","Price (EUR)","Additional info"
"978-3-031-75653-5","Deep Learning for Advanced X-ray Detection and Imaging Applications",,"Krzysztof (Kris) Iniewski; Liang (Kevin) Cai",2024,"1","https://doi.org/10.1007/978-3-031-75653-5",240,""