"eBook ISBN","Title","Subtitle","Authors/editors","Copyright year","Edition","DOI","Price (EUR)","Additional info"
"978-3-031-26708-6","Interconnect Reliability in Advanced Memory Device Packaging",,"Chong Leong, Gan; Chen-Yu, Huang",2023,"1","https://doi.org/10.1007/978-3-031-26708-6",400,""