"eBook ISBN","Title","Subtitle","Authors/editors","Copyright year","Edition","DOI","Price (EUR)","Additional info"
"978-3-031-10617-0","Technology Assessment in a Globalized World","Facing the Challenges of Transnational Technology Governance","Leonhard Hennen; Julia Hahn; Miltos Ladikas; Ralf Lindner; Walter Peissl; Rinie van Est",2023,"1","https://doi.org/10.1007/978-3-031-10617-0",,"Note: Open Access"