"eBook ISBN","Title","Subtitle","Authors/editors","Copyright year","Edition","DOI","Price (EUR)","Additional info"
"978-1-4939-6676-9","Scanning Electron Microscopy and X-Ray Microanalysis",,"Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy",2018,"4","https://doi.org/10.1007/978-1-4939-6676-9",419,""