"eBook ISBN","Title","Subtitle","Authors/editors","Copyright year","Edition","DOI","Price (EUR)","Additional info"
"978-1-4757-6069-9","On-Line Testing for VLSI",,"Michael Nicolaidis; Yervant Zorian; Dhiraj Pradhan",1998,"1","https://doi.org/10.1007/978-1-4757-6069-9",180,""