"eBook ISBN","Title","Subtitle","Authors/editors","Copyright year","Edition","DOI","Price (EUR)","Additional info"
"978-1-4615-2365-9","Testability Concepts for Digital ICs","The Macro Test Approach","F.P.M. Beenker; R.G. Bennetts; A.P. Thijssen",1995,"1","https://doi.org/10.1007/978-1-4615-2365-9",280,""